Chandru Ramamurthy, Zachary Giorno, Marek Turowski, Esko Mikkola. Modeling of Bias-Dependent Single Event Transients for Circuit Sensitivity Calculation. In 66th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2023, Tempe, AZ, USA, August 6-9, 2023. pages 870-874, IEEE, 2023. [doi]
@inproceedings{RamamurthyGTM23,
title = {Modeling of Bias-Dependent Single Event Transients for Circuit Sensitivity Calculation},
author = {Chandru Ramamurthy and Zachary Giorno and Marek Turowski and Esko Mikkola},
year = {2023},
doi = {10.1109/MWSCAS57524.2023.10406029},
url = {https://doi.org/10.1109/MWSCAS57524.2023.10406029},
researchr = {https://researchr.org/publication/RamamurthyGTM23},
cites = {0},
citedby = {0},
pages = {870-874},
booktitle = {66th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2023, Tempe, AZ, USA, August 6-9, 2023},
publisher = {IEEE},
isbn = {979-8-3503-0210-3},
}