Chandru Ramamurthy, Zachary Giorno, Marek Turowski, Esko Mikkola. Modeling of Bias-Dependent Single Event Transients for Circuit Sensitivity Calculation. In 66th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2023, Tempe, AZ, USA, August 6-9, 2023. pages 870-874, IEEE, 2023. [doi]
Abstract is missing.