Caio C. O. Ramos, João Paulo Papa, Andre N. Souza, Giovani Chiachia, Alexandre X. Falcão. What is the importance of selecting features for non-technical losses identification?. In International Symposium on Circuits and Systems (ISCAS 2011), May 15-19 2011, Rio de Janeiro, Brazil. pages 1045-1048, IEEE, 2011. [doi]
Abstract is missing.