Elias de Almeida Ramos, Ricardo Reis 0001. Using Lyapunov Exponents and Entropy to Estimate Sensitivity to Process Variability. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2023, Foz do Iguacu, Brazil, June 20-23, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.