SRAM memory margin probability failure estimation using Gaussian Process regression - researchr publication authors

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Manish Rana, Ramon Canal, Jie Han, Bruce F. Cockburn. SRAM memory margin probability failure estimation using Gaussian Process regression. In 34th IEEE International Conference on Computer Design, ICCD 2016, Scottsdale, AZ, USA, October 2-5, 2016. pages 448-451, IEEE Computer Society, 2016. [doi]

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