Manish Rana, Ramon Canal, Jie Han, Bruce F. Cockburn. SRAM memory margin probability failure estimation using Gaussian Process regression. In 34th IEEE International Conference on Computer Design, ICCD 2016, Scottsdale, AZ, USA, October 2-5, 2016. pages 448-451, IEEE Computer Society, 2016. [doi]
@inproceedings{RanaCHC16,
title = {SRAM memory margin probability failure estimation using Gaussian Process regression},
author = {Manish Rana and Ramon Canal and Jie Han and Bruce F. Cockburn},
year = {2016},
doi = {10.1109/ICCD.2016.7753325},
url = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2016.7753325},
researchr = {https://researchr.org/publication/RanaCHC16},
cites = {0},
citedby = {0},
pages = {448-451},
booktitle = {34th IEEE International Conference on Computer Design, ICCD 2016, Scottsdale, AZ, USA, October 2-5, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-5142-7},
}