Trap Density Modulation for IO FinFET NBTI Improvement - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Rakesh Ranjan, Charles B. LaRow, Ki-Don Lee, Minhyo Kang, Pavitra R. Perepa, Md. Shahriar Rahman, Bong-Ki Lee, David Moreau, Carolyn Cariss-Daniels, Timothy Basford, Colby Callahan, Maihan Nguyen, Gil Heyun Choi, Hyunchul Sagong, Hwasung Rhee. Trap Density Modulation for IO FinFET NBTI Improvement. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-5, IEEE, 2020. [doi]

This author has not been identified. Look up 'Rakesh Ranjan' in GoogleThis author has not been identified. Look up 'Charles B. LaRow' in GoogleThis author has not been identified. Look up 'Ki-Don Lee' in GoogleThis author has not been identified. Look up 'Minhyo Kang' in GoogleThis author has not been identified. Look up 'Pavitra R. Perepa' in GoogleThis author has not been identified. Look up 'Md. Shahriar Rahman' in GoogleThis author has not been identified. Look up 'Bong-Ki Lee' in GoogleThis author has not been identified. Look up 'David Moreau' in GoogleThis author has not been identified. Look up 'Carolyn Cariss-Daniels' in GoogleThis author has not been identified. Look up 'Timothy Basford' in GoogleThis author has not been identified. Look up 'Colby Callahan' in GoogleThis author has not been identified. Look up 'Maihan Nguyen' in GoogleThis author has not been identified. Look up 'Gil Heyun Choi' in GoogleThis author has not been identified. Look up 'Hyunchul Sagong' in GoogleThis author has not been identified. Look up 'Hwasung Rhee' in Google

runs on WebDSL