Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics

A. Ranjan, Nagarajan Raghavan, Sean J. O'Shea, Sen Mei, Michel Bosman, Kalya Shubhakar, Kin Leong Pey. Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 4, IEEE, 2018. [doi]

Abstract

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