New Graphical IDDQ Signatures Reduce Defect Level and Yield Loss - researchr publication authors

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Lan Rao, Michael L. Bushnell, Vishwani D. Agrawal. New Graphical IDDQ Signatures Reduce Defect Level and Yield Loss. In 16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India. pages 353-360, IEEE Computer Society, 2003. [doi]

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