Lan Rao, Michael L. Bushnell, Vishwani D. Agrawal. New Graphical IDDQ Signatures Reduce Defect Level and Yield Loss. In 16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India. pages 353-360, IEEE Computer Society, 2003. [doi]
@inproceedings{RaoBA03,
title = {New Graphical IDDQ Signatures Reduce Defect Level and Yield Loss},
author = {Lan Rao and Michael L. Bushnell and Vishwani D. Agrawal},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/vlsid/2003/1868/00/18680353abs.htm},
researchr = {https://researchr.org/publication/RaoBA03},
cites = {0},
citedby = {0},
pages = {353-360},
booktitle = {16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-1868-0},
}