Rahul M. Rao, Jeffrey L. Burns, Anirudh Devgan, Richard B. Brown. Efficient techniques for gate leakage estimation. In Ingrid Verbauwhede, Hyung Roh, editors, Proceedings of the 2003 International Symposium on Low Power Electronics and Design, 2003, Seoul, Korea, August 25-27, 2003. pages 100-103, ACM, 2003. [doi]
@inproceedings{RaoBDB03,
title = {Efficient techniques for gate leakage estimation},
author = {Rahul M. Rao and Jeffrey L. Burns and Anirudh Devgan and Richard B. Brown},
year = {2003},
doi = {10.1145/871506.871533},
url = {http://doi.acm.org/10.1145/871506.871533},
researchr = {https://researchr.org/publication/RaoBDB03},
cites = {0},
citedby = {0},
pages = {100-103},
booktitle = {Proceedings of the 2003 International Symposium on Low Power Electronics and Design, 2003, Seoul, Korea, August 25-27, 2003},
editor = {Ingrid Verbauwhede and Hyung Roh},
publisher = {ACM},
isbn = {1-58113-682-X},
}