A new design-for-test technique for reducing SOC test time

C. V. Guru Rao, D. Roy Chowdhury. A new design-for-test technique for reducing SOC test time. In Hiroto Yasuura, editor, Proceedings of the 2003 Asia and South Pacific Design Automation Conference, ASP-DAC '03, Kitakyushu, Japan, January 21-24, 2003. pages 879-882, ACM, 2003. [doi]

Abstract

Abstract is missing.