Huifei Rao, Jie Chen, Changhong Yu, Woon Tiong Ang, I-Chyn Wey, An-Yeu Wu, Hong Zhao. Ensemble Dependent Matrix Methodology for Probabilistic-Based Fault-tolerant Nanoscale Circuit Design. In International Symposium on Circuits and Systems (ISCAS 2007), 27-20 May 2007, New Orleans, Louisiana, USA. pages 1803-1806, IEEE, 2007. [doi]
Abstract is missing.