Rajeev R. Rao, Anirudh Devgan, David Blaauw, Dennis Sylvester. Parametric yield estimation considering leakage variability. In Sharad Malik, Limor Fix, Andrew B. Kahng, editors, Proceedings of the 41th Design Automation Conference, DAC 2004, San Diego, CA, USA, June 7-11, 2004. pages 442-447, ACM, 2004. [doi]
Abstract is missing.