Wenjing Rao, Alex Orailoglu, Ramesh Karri. Interactive presentation: Logic level fault tolerance approaches targeting nanoelectronics PLAs. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 865-869, ACM, 2007. [doi]
Abstract is missing.