Body biasing for analog design: Practical experiences in 22 nm FD-SOI - researchr publication authors

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Sunil Satish Rao, Benjamin Prautsch, Ashish Shrivastava, Torsten Reich. Body biasing for analog design: Practical experiences in 22 nm FD-SOI. In Manfred Dietrich, Ondrej Novák, editors, 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2017, Dresden, Germany, April 19-21, 2017. pages 73-78, IEEE, 2017. [doi]

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