Sunil Satish Rao, Benjamin Prautsch, Ashish Shrivastava, Torsten Reich. Body biasing for analog design: Practical experiences in 22 nm FD-SOI. In Manfred Dietrich, Ondrej Novák, editors, 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2017, Dresden, Germany, April 19-21, 2017. pages 73-78, IEEE, 2017. [doi]
@inproceedings{RaoPSR17,
title = {Body biasing for analog design: Practical experiences in 22 nm FD-SOI},
author = {Sunil Satish Rao and Benjamin Prautsch and Ashish Shrivastava and Torsten Reich},
year = {2017},
doi = {10.1109/DDECS.2017.7934580},
url = {https://doi.org/10.1109/DDECS.2017.7934580},
researchr = {https://researchr.org/publication/RaoPSR17},
cites = {0},
citedby = {0},
pages = {73-78},
booktitle = {20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2017, Dresden, Germany, April 19-21, 2017},
editor = {Manfred Dietrich and Ondrej Novák},
publisher = {IEEE},
isbn = {978-1-5386-0472-4},
}