Md Raquibuzzaman, Md. Mehedi Hasan, Aleksandar Milenkovic, Biswajit Ray. Layer-to-Layer Endurance Variation of 3D NAND Flash Memory. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 1-5, IEEE, 2022. [doi]
@inproceedings{RaquibuzzamanHM22,
title = {Layer-to-Layer Endurance Variation of 3D NAND Flash Memory},
author = {Md Raquibuzzaman and Md. Mehedi Hasan and Aleksandar Milenkovic and Biswajit Ray},
year = {2022},
doi = {10.1109/IRPS48227.2022.9764441},
url = {https://doi.org/10.1109/IRPS48227.2022.9764441},
researchr = {https://researchr.org/publication/RaquibuzzamanHM22},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022},
publisher = {IEEE},
isbn = {978-1-6654-7950-9},
}