Md Raquibuzzaman, Md. Mehedi Hasan, Aleksandar Milenkovic, Biswajit Ray. Layer-to-Layer Endurance Variation of 3D NAND Flash Memory. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 1-5, IEEE, 2022. [doi]
Abstract is missing.