Muhammad Rashedul Haq Rashed, Amro Awad, Sumit Kumar Jha 0001, Rickard Ewetz. Towards resilient analog in-memory deep learning via data layout re-organization. In Rob Oshana, editor, DAC '22: 59th ACM/IEEE Design Automation Conference, San Francisco, California, USA, July 10 - 14, 2022. pages 859-864, ACM, 2022. [doi]
@inproceedings{RashedA0E22,
title = {Towards resilient analog in-memory deep learning via data layout re-organization},
author = {Muhammad Rashedul Haq Rashed and Amro Awad and Sumit Kumar Jha 0001 and Rickard Ewetz},
year = {2022},
doi = {10.1145/3489517.3530532},
url = {https://doi.org/10.1145/3489517.3530532},
researchr = {https://researchr.org/publication/RashedA0E22},
cites = {0},
citedby = {0},
pages = {859-864},
booktitle = {DAC '22: 59th ACM/IEEE Design Automation Conference, San Francisco, California, USA, July 10 - 14, 2022},
editor = {Rob Oshana},
publisher = {ACM},
isbn = {978-1-4503-9142-9},
}