Muhammad Rashedul Haq Rashed, Amro Awad, Sumit Kumar Jha 0001, Rickard Ewetz. Towards resilient analog in-memory deep learning via data layout re-organization. In Rob Oshana, editor, DAC '22: 59th ACM/IEEE Design Automation Conference, San Francisco, California, USA, July 10 - 14, 2022. pages 859-864, ACM, 2022. [doi]
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