A methodology to reuse random IP stimuli in an SoC functional verification environment

V. S. Rashmi, Giridhar Somayaji, Sirisha Bhamidipathi. A methodology to reuse random IP stimuli in an SoC functional verification environment. In 19th International Symposium on VLSI Design and Test, VDAT 2015, Ahmedabad, India, June 26-29, 2015. pages 1-5, IEEE, 2015. [doi]

Authors

V. S. Rashmi

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Giridhar Somayaji

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Sirisha Bhamidipathi

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