Feim Ridvan Rasim, Canan Kocar, Sebastian M. Sattler. Structure-preserving modeling of safety-critical combinational circuits. In Manfred Dietrich, Ondrej Novák, editors, 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2017, Dresden, Germany, April 19-21, 2017. pages 109-114, IEEE, 2017. [doi]
Abstract is missing.