Variability analysis of FinFET-based devices and circuits considering electrical confinement and width quantization - researchr publication authors

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Seid Hadi Rasouli, Kazuhiko Endo, Kaustav Banerjee. Variability analysis of FinFET-based devices and circuits considering electrical confinement and width quantization. In 2009 International Conference on Computer-Aided Design (ICCAD 09), November 2-5, 2009, San Jose, CA, USA. pages 505-512, IEEE, 2009. [doi]

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