Seid Hadi Rasouli, Kazuhiko Endo, Kaustav Banerjee. Variability analysis of FinFET-based devices and circuits considering electrical confinement and width quantization. In 2009 International Conference on Computer-Aided Design (ICCAD 09), November 2-5, 2009, San Jose, CA, USA. pages 505-512, IEEE, 2009. [doi]
@inproceedings{RasouliEB09,
title = {Variability analysis of FinFET-based devices and circuits considering electrical confinement and width quantization},
author = {Seid Hadi Rasouli and Kazuhiko Endo and Kaustav Banerjee},
year = {2009},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5361245},
tags = {analysis},
researchr = {https://researchr.org/publication/RasouliEB09},
cites = {0},
citedby = {0},
pages = {505-512},
booktitle = {2009 International Conference on Computer-Aided Design (ICCAD 09), November 2-5, 2009, San Jose, CA, USA},
publisher = {IEEE},
}