Work-function variation induced fluctuation in bias-temperature-instability characteristics of emerging metal-gate devices and implications for digital design - researchr publication authors

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Seid Hadi Rasouli, Kazuhiko Endo, Kaustav Banerjee. Work-function variation induced fluctuation in bias-temperature-instability characteristics of emerging metal-gate devices and implications for digital design. In 2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA. pages 714-720, IEEE, 2010. [doi]

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