Seid Hadi Rasouli, Kazuhiko Endo, Kaustav Banerjee. Work-function variation induced fluctuation in bias-temperature-instability characteristics of emerging metal-gate devices and implications for digital design. In 2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA. pages 714-720, IEEE, 2010. [doi]
@inproceedings{RasouliEB10,
title = {Work-function variation induced fluctuation in bias-temperature-instability characteristics of emerging metal-gate devices and implications for digital design},
author = {Seid Hadi Rasouli and Kazuhiko Endo and Kaustav Banerjee},
year = {2010},
doi = {10.1109/ICCAD.2010.5654260},
url = {http://dx.doi.org/10.1109/ICCAD.2010.5654260},
tags = {design},
researchr = {https://researchr.org/publication/RasouliEB10},
cites = {0},
citedby = {0},
pages = {714-720},
booktitle = {2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA},
publisher = {IEEE},
}