Aarti Rathi, Abhisek Dixit, Naga Satish, P. Srinivasan 0002, Fernando Guarin. Reliability of SPST Series-stacked SOI CMOS RF Switches for mmWave Applications. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.