Jiann-Chyi Rau, Kuo-Chun Kuo. An Enhanced Tree-Structured Scan Chain for Pseudo-Exhaustive Testing of VLSI Circuits. In Proceedings of the 3rd IEEE International Workshop on System-on-Chip for Real-Time Applications (IWSOC 03), 30 June - 2 July 2003, Calgary, Alberta, Canada. pages 374-377, IEEE Computer Society, 2003. [doi]
@inproceedings{RauK03,
title = {An Enhanced Tree-Structured Scan Chain for Pseudo-Exhaustive Testing of VLSI Circuits},
author = {Jiann-Chyi Rau and Kuo-Chun Kuo},
year = {2003},
doi = {10.1109/IWSOC.2003.1213065},
url = {http://doi.ieeecomputersociety.org/10.1109/IWSOC.2003.1213065},
tags = {testing},
researchr = {https://researchr.org/publication/RauK03},
cites = {0},
citedby = {0},
pages = {374-377},
booktitle = {Proceedings of the 3rd IEEE International Workshop on System-on-Chip for Real-Time Applications (IWSOC 03), 30 June - 2 July 2003, Calgary, Alberta, Canada},
publisher = {IEEE Computer Society},
isbn = {0-7695-1944-X},
}