Jiann-Chyi Rau, Kuo-Chun Kuo. An Enhanced Tree-Structured Scan Chain for Pseudo-Exhaustive Testing of VLSI Circuits. In Proceedings of the 3rd IEEE International Workshop on System-on-Chip for Real-Time Applications (IWSOC 03), 30 June - 2 July 2003, Calgary, Alberta, Canada. pages 374-377, IEEE Computer Society, 2003. [doi]
Abstract is missing.