Taras Ravsher, Andrea Fantini, Adrian Vaisman Chasin, Shamin H. Sharifi, Hubert Hody, Harold Dekkers, Thomas Witters, Jan Van Houdt, Valeri Afanas'ev, Sebastien Couet, Gouri Sankar Kar. Degradation mechanism of amorphous IGZO-based bipolar metal-semiconductor-metal selectors. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 10-1, IEEE, 2022. [doi]
@inproceedings{RavsherFCSHDWHA22,
title = {Degradation mechanism of amorphous IGZO-based bipolar metal-semiconductor-metal selectors},
author = {Taras Ravsher and Andrea Fantini and Adrian Vaisman Chasin and Shamin H. Sharifi and Hubert Hody and Harold Dekkers and Thomas Witters and Jan Van Houdt and Valeri Afanas'ev and Sebastien Couet and Gouri Sankar Kar},
year = {2022},
doi = {10.1109/IRPS48227.2022.9764424},
url = {https://doi.org/10.1109/IRPS48227.2022.9764424},
researchr = {https://researchr.org/publication/RavsherFCSHDWHA22},
cites = {0},
citedby = {0},
pages = {10},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022},
publisher = {IEEE},
isbn = {978-1-6654-7950-9},
}