Akhilesh Rawat, Anjali Goel, Brajesh Rawat. Role of Interface Trap Charges in the Performance of Monolayer and Bilayer MoS2-based Field-Effect Transistors. In 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems, VLSID 2022, Bangalore, India, February 26 - March 2, 2022. pages 303-308, IEEE, 2022. [doi]
Abstract is missing.