Dual use of superscalar datapath for transient-fault detection and recovery - researchr publication authors

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Joydeep Ray, James C. Hoe, Babak Falsafi. Dual use of superscalar datapath for transient-fault detection and recovery. In Proceedings of the 34th Annual International Symposium on Microarchitecture, Austin, Texas, USA, December 1-5, 2001. pages 214-224, ACM/IEEE, 2001. [doi]

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