Dual use of superscalar datapath for transient-fault detection and recovery

Joydeep Ray, James C. Hoe, Babak Falsafi. Dual use of superscalar datapath for transient-fault detection and recovery. In Proceedings of the 34th Annual International Symposium on Microarchitecture, Austin, Texas, USA, December 1-5, 2001. pages 214-224, ACM/IEEE, 2001. [doi]

@inproceedings{RayHF01,
  title = {Dual use of superscalar datapath for transient-fault detection and recovery},
  author = {Joydeep Ray and James C. Hoe and Babak Falsafi},
  year = {2001},
  doi = {10.1145/563998.564027},
  url = {http://doi.acm.org/10.1145/563998.564027},
  tags = {C++},
  researchr = {https://researchr.org/publication/RayHF01},
  cites = {0},
  citedby = {0},
  pages = {214-224},
  booktitle = {Proceedings of the 34th Annual International Symposium on Microarchitecture, Austin, Texas, USA, December 1-5, 2001},
  publisher = {ACM/IEEE},
}