Total ionizing dose effect of bulk and SOI P-FinFET with linear workfunction modulation technology

Abhishek Ray, Alok Naugarhiya, Guru Prasad Mishra. Total ionizing dose effect of bulk and SOI P-FinFET with linear workfunction modulation technology. Microelectronics Journal, 137:105822, 2023. [doi]

Abstract

Abstract is missing.