A novel delay fault testing methodology using on-chip low-overhead delay measurement hardware at strategic probe points - researchr publication authors

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Arijit Raychowdhury, Swaroop Ghosh, Swarup Bhunia, Debjyoti Ghosh, Kaushik Roy. A novel delay fault testing methodology using on-chip low-overhead delay measurement hardware at strategic probe points. In 10th European Test Symposium (ETS 2005), May 22-25, 2005, Tallinn, Estonia. pages 108-113, IEEE, 2005. [doi]

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