Arijit Raychowdhury, Swaroop Ghosh, Swarup Bhunia, Debjyoti Ghosh, Kaushik Roy. A novel delay fault testing methodology using on-chip low-overhead delay measurement hardware at strategic probe points. In 10th European Test Symposium (ETS 2005), May 22-25, 2005, Tallinn, Estonia. pages 108-113, IEEE, 2005. [doi]
@inproceedings{RaychowdhuryGBGR05,
title = {A novel delay fault testing methodology using on-chip low-overhead delay measurement hardware at strategic probe points},
author = {Arijit Raychowdhury and Swaroop Ghosh and Swarup Bhunia and Debjyoti Ghosh and Kaushik Roy},
year = {2005},
doi = {10.1109/ETS.2005.2},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2005.2},
researchr = {https://researchr.org/publication/RaychowdhuryGBGR05},
cites = {0},
citedby = {0},
pages = {108-113},
booktitle = {10th European Test Symposium (ETS 2005), May 22-25, 2005, Tallinn, Estonia},
publisher = {IEEE},
isbn = {0-7695-2341-2},
}