Douglas W. Raymond, D. Eugene Wedge, Philip J. Stringer, Harold W. Ng, Suzanne T. Jennings, Craig T. Pynn, Winsor Soule Jr.. Algorithmic Extraction of BSDL from 1149.1-compliant Sample ICs. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 561-568, IEEE Computer Society, 1995.
Abstract is missing.