Paolo Rech, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Luigi Dilillo. A Memory Fault Simulator for Radiation-Induced Effects in SRAMs. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 100-105, IEEE Computer Society, 2010. [doi]
@inproceedings{RechBGPVD10,
title = {A Memory Fault Simulator for Radiation-Induced Effects in SRAMs},
author = {Paolo Rech and Alberto Bosio and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel and Luigi Dilillo},
year = {2010},
doi = {10.1109/ATS.2010.26},
url = {http://dx.doi.org/10.1109/ATS.2010.26},
researchr = {https://researchr.org/publication/RechBGPVD10},
cites = {0},
citedby = {0},
pages = {100-105},
booktitle = {Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-4248-5},
}