Paolo Rech, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Luigi Dilillo. A Memory Fault Simulator for Radiation-Induced Effects in SRAMs. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 100-105, IEEE Computer Society, 2010. [doi]
Abstract is missing.