Maximizing the Functional Yield of Wafer-to-Wafer 3-D Integration

Sherief Reda, Gregory Smith 0002, Larry Smith 0004. Maximizing the Functional Yield of Wafer-to-Wafer 3-D Integration. IEEE Trans. VLSI Syst., 17(9):1357-1362, 2009. [doi]

@article{Reda0009,
  title = {Maximizing the Functional Yield of Wafer-to-Wafer 3-D Integration},
  author = {Sherief Reda and Gregory Smith 0002 and Larry Smith 0004},
  year = {2009},
  doi = {10.1109/TVLSI.2008.2003513},
  url = {http://dx.doi.org/10.1109/TVLSI.2008.2003513},
  researchr = {https://researchr.org/publication/Reda0009},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. VLSI Syst.},
  volume = {17},
  number = {9},
  pages = {1357-1362},
}