A Cost-Effective Fault Tolerance Technique for Functional TSV in 3-D ICs

Raviteja P. Reddy, Amit Acharyya, S. Saqib Khursheed. A Cost-Effective Fault Tolerance Technique for Functional TSV in 3-D ICs. IEEE Trans. VLSI Syst., 25(7):2071-2080, 2017. [doi]

Abstract

Abstract is missing.