Vijay Reddy, John Carulli, Anand T. Krishnan, William Bosch, Brendan Burgess. Impact of Negative Bias Temperature Instability on Product Parametric Drift. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 148-155, IEEE, 2004. [doi]
Abstract is missing.