Cluster-based detection of SEU-caused errors in LUTs of SRAM-based FPGAs

E. Syam Sundar Reddy, Vikram Chandrasekhar, Milagros Sashikánth, V. Kamakoti, Narayanan Vijaykrishnan. Cluster-based detection of SEU-caused errors in LUTs of SRAM-based FPGAs. In Ting-Ao Tang, editor, Proceedings of the 2005 Conference on Asia South Pacific Design Automation, ASP-DAC 2005, Shanghai, China, January 18-21, 2005. pages 1200-1203, ACM Press, 2005. [doi]

Abstract

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