Sudhakar M. Reddy, Irith Pomeranz, Nadir Z. Basturkmen, Xijiang Lin. Procedures for Identifying Undetectable and Redundant Faults In Synchronous Sequential Circuits. In 17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA. pages 275-283, IEEE Computer Society, 1999. [doi]
Abstract is missing.