Sudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara. On the effects of test compaction on defect coverage. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 430-437, IEEE Computer Society, 1996. [doi]
@inproceedings{ReddyPK96,
title = {On the effects of test compaction on defect coverage},
author = {Sudhakar M. Reddy and Irith Pomeranz and Seiji Kajihara},
year = {1996},
url = {http://csdl.computer.org/comp/proceedings/vts/1996/7304/00/73040430abs.htm},
tags = {test coverage, testing, coverage},
researchr = {https://researchr.org/publication/ReddyPK96},
cites = {0},
citedby = {0},
pages = {430-437},
booktitle = {14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA},
publisher = {IEEE Computer Society},
}