The following publications are possibly variants of this publication:
- Compact test sets for high defect coverageSudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara. tcad, 16(8):923-930, 1997. [doi]
- On Improving Defect Coverage of Stuck-at Fault TestsKohei Miyase, Kenta Terashima, Seiji Kajihara, Xiaoqing Wen, Sudhakar M. Reddy. ats 2005: 216-223 [doi]
- Test sequences to achieve high defect coverage for synchronous sequential circuitsIrith Pomeranz, Sudhakar M. Reddy. tcad, 17(10):1017-1029, 1998. [doi]