Manu Rehani, David Abercrombie, Robert Madge, Jim Teisher, Jason Saw. ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 181-189, IEEE, 2004. [doi]
@inproceedings{RehaniAMTS04,
title = {ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test},
author = {Manu Rehani and David Abercrombie and Robert Madge and Jim Teisher and Jason Saw},
year = {2004},
doi = {10.1109/ITC.2004.37},
url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.37},
tags = {testing, data-flow},
researchr = {https://researchr.org/publication/RehaniAMTS04},
cites = {0},
citedby = {0},
pages = {181-189},
booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA},
publisher = {IEEE},
isbn = {0-7803-8581-0},
}