Uwe Reisgen, S. Mann, L. Oster, G. Gött, R. Sharma, D. Uhrlandt. Study on identifying GMAW process deviations by means of optical and electrical process data using ANN. In 16th IEEE International Conference on Automation Science and Engineering, CASE 2020, Hong Kong, August 20-21, 2020. pages 1596-1601, IEEE, 2020. [doi]
Abstract is missing.