Santiago Remersaro, Xijiang Lin, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski. Low Shift and Capture Power Scan Tests. In 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India. pages 793-798, IEEE Computer Society, 2007. [doi]
@inproceedings{RemersaroLRPR07,
title = {Low Shift and Capture Power Scan Tests},
author = {Santiago Remersaro and Xijiang Lin and Sudhakar M. Reddy and Irith Pomeranz and Janusz Rajski},
year = {2007},
doi = {10.1109/VLSID.2007.101},
url = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2007.101},
tags = {testing},
researchr = {https://researchr.org/publication/RemersaroLRPR07},
cites = {0},
citedby = {0},
pages = {793-798},
booktitle = {20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2502-4},
}